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Radar/EW
Denser networks, denser devices; the question is: how to test the I/O ports? - Story
July 08, 2008
Advanced packaging and integrated circuit manufacturing techniques have resulted in multi-port devices that are difficult to characterize using traditional two- or even four-port Vector Network Analyzers (VNAs). A new class of test set extends the capabilities of the traditional VNA to N-ports, which provides full S-Parameter characterization of multi-port devices.
Articles 1 - 1
